Kazuma FUTIMOTO

Department of Computer and Network EngineeringAssistant Professor
Cluster I (Informatics and Computer Engineering)Assistant Professor

Research Keyword

  • 離散最適化
  • 組合せ最適化
  • 人工知能
  • 機械学習
  • テスト理論
  • ベイズ統計
  • データサイエンス

Field Of Study

  • Informatics, Mathematical informatics
  • Informatics, Statistical science
  • Informatics, Learning support systems

Career

  • Apr. 2025 - Present
    The University of Electro-Communications, Graduate School of Informatics and Engineering, School of Informatics and Engineering Department of Computer and Network Engineering, Cluster I(Informatics and Computer Engineering), Assistant professor, Japan
  • Apr. 2024 - Mar. 2025
    日本学術振興会特別研究員(DC2)

Educational Background

  • Apr. 2022 - Mar. 2025
    The University of Electro-Communications, Graduate School of Informatics and Engineering, Department of Computer and Network Engineering, Japan
  • Apr. 2020 - Mar. 2022
    The University of Electro-Communications, Graduate School of Informatics and Engineering, Department of Computer and Network Engineering, Japan
  • Apr. 2016 - Mar. 2020
    The University of Electro-Communications, School of Informatics and Engineering, 先端工学基礎課程, Japan

Member History

  • Feb. 2025 - Jul. 2025
    18th International Conference on Educational Data Mining (EDM2025), Program Committee., the International Educational Data Mining Society
  • Jan. 2024 - Jul. 2024
    17th International Conference on Educational Data Mining (EDM2024), Program Committee., the International Educational Data Mining Society
  • Dec. 2022 - Jul. 2023
    24th International Conference on Artificial Intelligence in Education (AIED2023), Local Committee.

Award

  • May 2024
    人工知能学会
    所要時間におけるDeep-IRTを用いて制限時間を考慮した自動並行テスト構成
    人工知能学会 全国大会優秀賞 [オーガナイズドセッション口頭発表部門], 石川 文弥;渕本 壱真;岸田 若葉;堤 瑛美子;植野 真臣
  • Mar. 2023
    日本テスト学会
    等質テスト構成の並列化技術を用いた2段階等質適応型テスト
    日本テスト学会大会発表賞, 宮澤芳光;渕本壱真;植野真臣

Paper

  • Computerized Adaptive Testing to Balance Exposure Bias and Measurement Accuracy Using Zero-Suppressed Binary Decision Diagrams
    Maomi Ueno; Kazuma Fuchimoto; Wakaba Kishida; Yoshimitsu Miyazawa
    IEEE Access, 13, 1, 33883-33903, 19 Feb. 2025, Peer-reviwed
    Scientific journal, English
  • 項目難易度制約付き等質適応型テスト
    岸田 若葉; 渕本 壱真; 宮澤 芳光; 植野 真臣
    電子情報通信学会論文誌 D, Vol.J107-D, 10, 506-517, Oct. 2024, Peer-reviwed
    Scientific journal, Japanese
  • Automated Parallel Test Assembly Using Integer Programming with Item Exposure Penalties
    Kazuma Fuchimoto; Ueno Maomi
    Lead, Proceedings of the Institute of Statistical Mathematics, 72, 1, 43-59, Jun. 2024, Peer-reviwed
    Scientific journal, Japanese
  • Automated Parallel Test Forms Assembly using Zero-suppressed Binary Decision Diagrams
    Kazuma Fuchimoto; Shin-Ichi Minato; Maomi Ueno
    Lead, IEEE Access, 11, 1, 112804-112813, Oct. 2023, Peer-reviwed
    Scientific journal, English
  • Item Difficulty Constrained Uniform Adaptive Testing
    Wakaba Kishida; Kazuma Fuchimoto; Yoshimitsu Miyazawa; Maomi Ueno
    Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky, 1831, 568-573, Jun. 2023, Peer-reviwed
  • Automated Test Assmbly using Zero-suppressed Binary Decision Diagrams
    渕本壱真; 湊真一; 植野真臣
    人工知能学会論文誌(Web), 37, 5, Sep. 2022, Peer-reviwed
    Scientific journal
  • Uniform Test Assembly with Lower Item Exposure Using Integer Programming
    植野晶; 渕本壱真; 植野真臣
    電子情報通信学会論文誌 D(Web), J105-D, 8, Aug. 2022, Peer-reviwed
    Scientific journal
  • Hybrid Maximum Clique Algorithm Using Parallel Integer Programming for Uniform Test Assembly
    Kazuma Fuchimoto; Takatoshi Ishii; Maomi Ueno
    IEEE Transactions on Learning Technologies, 01 Apr. 2022
    Scientific journal
  • e-Testing from artificial intelligence approach
    Maomi Ueno; Kazuma Fuchimoto; Emiko Tsutsumi
    Behaviormetrika, Jul. 2021, Peer-reviwed, Invited
    Scientific journal, English
  • Parallel Maximum Clique Algorithm Using Integer Programming for Uniform Test Forms Assembly
    渕本壱真; 植野真臣
    電子情報通信学会論文誌 D(Web), J103-D, 12, Dec. 2020, Peer-reviwed
    Scientific journal

MISC

  • 出題頻度の偏りと測定精度のトレードオフを制御する ZDD を用いた二段階等質適応型テスト
    渕本壱真; 植野真臣
    Lead, Aug. 2024, 第49回 教育システム情報学会全国大会, Summary national conference
  • 所要時間のためのガウス過程を用いたMulti-Task Deep Neural Network により制限時間を考慮する自動テスト構成
    石川文弥; 渕本壱真; 植野真臣
    Aug. 2024, 第49回 教育システム情報学会全国大会, Summary national conference
  • Multi-Task Deep Gaussian Process for predicting item response time
    石川文弥; 渕本壱真; 植野真臣
    Jul. 2024, 人工知能学会先進的学習科学と工学研究会資料, 101st, Summary national conference, 1349-4104, 202402259325729069
  • Automated Test Assembly using Maximum Weight Clique Algorithm
    門脇瑞穂; 渕本壱真; 植野真臣
    May 2024, 人工知能学会全国大会論文集(Web), 38th, Summary national conference, 2758-7347, 202402278707439745
  • Automated parallel test forms assembly for time limitation using Deep-IRT with prediction of item response time
    石川文弥; 渕本壱真; 岸田若葉; 堤瑛美子; 植野真臣
    May 2024, 人工知能学会全国大会論文集(Web), 38th, Summary national conference, 2758-7347, 202402291861203166
  • Multiple Zero-suppressed Binary Decision Diagramsによる自動テスト構成
    渕本壱真; 植野真臣
    Lead, Aug. 2023, 第48回 教育システム情報学会全国大会, Japanese, Summary national conference
  • Integer Programming with Logistic Item Exposure Penalties for Automated Test Assembly
    渕本壱真; 植野真臣
    Lead, Jun. 2023, 人工知能学会全国大会論文集(Web), 37th, Summary national conference, 2758-7347, 202302236426837223
  • Item Difficulty Constrained Uniform Adaptive Testing for Reducing Bias of Item Exposure
    岸田若葉; 渕本壱真; 宮澤芳光; 植野真臣
    Jun. 2023, 人工知能学会全国大会論文集(Web), 37th, Summary national conference, 2758-7347, 202302215954970825
  • Automated Test Assembly using Maximum Weight Clique Algorithm
    門脇瑞穂; 渕本壱真; 植野真臣
    Jun. 2023, 人工知能学会全国大会論文集(Web), 37th, Summary national conference, 2758-7347, 202302282082576474
  • Two stages uniform adaptive testing to control measurement accuracy
    宮澤芳光; 渕本壱真; 植野真臣
    Nov. 2022, 人工知能学会先進的学習科学と工学研究会資料, 96th, Summary national conference, 1349-4104, 202202268520389739
  • Maximum Clique Algorithm using Integer Programming for Reducing Item Exposure Bias in Automated Test Assembly
    渕本壱真; 植野真臣
    Lead, Aug. 2022, 教育システム情報学会全国大会講演論文集(CD-ROM), 47th, Summary national conference, 202302230481558801
  • Uniform Test Assmbly using Zero-suppressed Binary Decision Diagrams
    渕本壱真; 湊真一; 植野真臣
    Lead, Jun. 2022, 人工知能学会全国大会論文集(Web), 36th, Summary national conference, 2758-7347, 202202222854525669
  • Uniform Test Assembly with Lower Item Exposure Using Integer Programming
    植野晶; 渕本壱真; 植野真臣
    Jun. 2021, 人工知能学会全国大会論文集(Web), 35th, Summary national conference, 2758-7347, 202102253239805141
  • Parallel Maximum Clique Algorithm for Uniform Test Assembly
    渕本壱真; 植野真臣
    Lead, Jun. 2020, 人工知能学会全国大会論文集(Web), 34th, Summary national conference, 2758-7347, 202002265768519592

Courses

  • 情報領域演習第二
    Apr. 2025 - Present
    電気通信大学

Affiliated academic society

  • 人工知能学会
  • 教育システム情報学会

Research Themes

  • 反応確率推定と解釈性を保証するBayesian network knowledge tracing
    植野 真臣; 菅原聖太; 渕本壱真
    日本学術振興会, 科学研究費助成事業, 電気通信大学, 挑戦的研究(萌芽), 25K22839
    Jun. 2025 - Mar. 2028
  • ZDDを用いた等質適応型テストの開発
    渕本 壱真
    日本学術振興会, 科学研究費助成事業, 電気通信大学, 特別研究員奨励費, 24KJ1124
    23 Apr. 2024 - 31 Mar. 2026

Academic Contribution Activities

  • Behaviormetrika, Springer
    Peer review etc, Peer review, 01 Aug. 2023 - Present