KATSUYOSHI SAKAMOTO

Department of Engineering ScienceAssistant Professor
Cluster III (Fundamental Science and Engineering)Assistant Professor
Researcher Information

Degree

  • 修士(工学), 電気通信大学

Field Of Study

  • Manufacturing technology (mechanical, electrical/electronic, chemical engineering), Electric/electronic material engineering
  • Nanotechnology/Materials, Thin-film surfaces and interfaces
  • Nanotechnology/Materials, Crystal engineering
  • Nanotechnology/Materials, Applied materials

Educational Background

  • 1992
    The University of Electro-Communications, 電気通信学研究科, 電子工学専攻, Japan
  • 1992
    The University of Electro-Communications, Graduate School, Division of Electro Communications
  • 1991
    The University of Electro-Communications, Faculty of Electro-Communications, Department of Electronic Engineering, Japan
  • 1991
    The University of Electro-Communications, Faculty of Electro Communications
Research Activity Information

MISC

  • Surface electromigration of in-covered Si high-index surfaces
    K Sakamoto; Y Matsubayashi; M Shimada; T Yamada; A Natori; H Yasunaga
    May 2003, APPLIED SURFACE SCIENCE, 212, 249-254, English, 0169-4332, WOS:000183967200047
  • UHV-SEMを用いたVicinal Si(001)表面エレクトロマイグレーションの その場観察
    2003, 日本物理学会講演概要集
  • Surface Electromigration Analysis for using Multi-electrodes Method
    2002
  • Surface Electromigration Analysis for using Multi-electrodes Method
    2002
  • Structure analysis of oxygen-adsorbed tungsten (001) surface
    H Yamazaki; T Kamisawa; T Kokubun; T Haga; S Kamimizu; K Sakamoto
    Apr. 2001, SURFACE SCIENCE, 477, 2-3, 174-178, English, 0039-6028, 80012419846, WOS:000168314500013
  • 低温における酸素吸着W(001)表面の構造解析
    2001, 日本物理学会講演概要集, 56, 2第4分冊
  • Surface electromigration of In on vicinal Si(001)
    K Sakamoto; NJ Wu; A Natori; H Yasunaga
    Jan. 2001, APPLIED SURFACE SCIENCE, 169, 480-484, English, 0169-4332, WOS:000167087700098
  • Surface electromigration of Au ultrathin film on MoS2
    NJ Wu; S Shimizu; MT Hermie; K Sakamoto; A Natori; H Yasunaga
    Jan. 2001, APPLIED SURFACE SCIENCE, 169, 485-488, English, 0169-4332, WOS:000167087700099
  • 半導体MoS2表面上のAu表面エレクトロマイグレーション
    1999, 第46回応用物理学関連連合講演会, 684
  • In/Si(001)のファセット形成と表面エレクトロマイグレーション
    1999, 第46回応用物理学関連連合講演会, 681
  • エレクトロマイグレーションによるシリコン表面加工
    1999, 電気通信大学サテライトベンチャービジネスラボラトリー,平成10年度研究成果報告要旨集, 45
  • アニールした酸素吸着W(001)表面の構造解析
    1999, 日本物理学会講演概要集, 54, 2第4分冊, 821
  • Structure Analysis of Hydrogen-Adsorbed V(001)
    1999, Surface 真空(増刊), 42, 53
  • ELECTROMIGRATION OF Au ULTRATHIN FILM ON MoS2 SURFACE
    1999, Vacuum and Surface Sciences Conference of Asia and Australia(Tokyo)
  • SURFACE ELECTROMIGRATION OF In ON VICINAL Si(001)
    1999, Vacuum and Surface Sciences Conference of Asia and Australia(Tokyo)
  • Structure Analysis of Hydrogen-Adsorbed V(001)
    1999, Surface 真空(増刊), 42, 53
  • ELECTROMIGRATION OF Au ULTRATHIN FILM ON MoS2 SURFACE
    1999, Vacuum and Surface Sciences Conference of Asia and Australia(Tokyo)
  • SURFACE ELECTROMIGRATION OF In ON VICINAL Si(001)
    1999, Vacuum and Surface Sciences Conference of Asia and Australia(Tokyo)
  • MoS2表面上の金属質量輸送
    1998, 第18回表面科学講演大会, 97
  • 微斜面Si(001)面上のIn表面エレクトロマイグレーション
    1998, 第18回表面科学講演大会, 96

Affiliated academic society

  • 日本物理学会